CWS 640

CWS 640

CWS 640 is a robust laser system for process inline measurement of Surface quality parameters in the nanometer range.

CWS 640 concist of

  • CWS optical head
  • CWS Power unit with uninterrupted Power supply
  • CWS software for analyse and visualization
cws-schematic-description

CWS 640 4×4 Product Specification

 

  • Measurement area  ≥ 4×4 mm
  • Camera  2048 x 2048 pixels
  • Résolution x, y  2 µm
  • Depth of field  1 mm
  • Measuring time  1 ms
  • Analysis time  ≤ 0.2 sec
  • Resolution rms of the instrument Sq  10 nm < Sq < 350 nm
  • Required positioning acc.  < 1 mm (+/- 0,5 mm)
  • Working distance  75 mm

CWS 640 1×1 Product Specification

 

  • Measurement area ≥ 1×1 mm
  • Camera 2048 x 2048 pixels
  • Résolution x, y 0.5 µm
  • Depth of field 1 mm
  • Measuring time 1 ms
  • Analysis time ≤ 0.2 sec
  • Resolution rms of the instrument Sq 10 nm < Sq < 350 nm
  • Required positioning acc. < 0,2 mm (+/- 0,1 mm)
  • Working distance 16 mm

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